cryptui: Fix a failing test on Windows.
This commit is contained in:
parent
a900f5e065
commit
472984f565
|
@ -368,7 +368,7 @@ static void test_crypt_ui_wiz_import(void)
|
||||||
ok(!ret && GetLastError() == E_INVALIDARG,
|
ok(!ret && GetLastError() == E_INVALIDARG,
|
||||||
"expected E_INVALIDARG, got %08x\n", GetLastError());
|
"expected E_INVALIDARG, got %08x\n", GetLastError());
|
||||||
/* Imports the following cert--self-signed, with no basic constraints set--
|
/* Imports the following cert--self-signed, with no basic constraints set--
|
||||||
* to the root store. Puts up a dialog at the end if it succeeds or fails.
|
* to the CA store. Puts up a dialog at the end if it succeeds or fails.
|
||||||
*/
|
*/
|
||||||
info.u.pCertContext = CertCreateCertificateContext(X509_ASN_ENCODING,
|
info.u.pCertContext = CertCreateCertificateContext(X509_ASN_ENCODING,
|
||||||
v1CertWithValidPubKey, sizeof(v1CertWithValidPubKey));
|
v1CertWithValidPubKey, sizeof(v1CertWithValidPubKey));
|
||||||
|
@ -377,15 +377,15 @@ static void test_crypt_ui_wiz_import(void)
|
||||||
ok(ret, "CryptUIWizImport failed: %08x\n", GetLastError());
|
ok(ret, "CryptUIWizImport failed: %08x\n", GetLastError());
|
||||||
if (ret)
|
if (ret)
|
||||||
{
|
{
|
||||||
static const WCHAR Root[] = { 'R','o','o','t',0 };
|
static const WCHAR CA[] = { 'C','A',0 };
|
||||||
HCERTSTORE root = CertOpenStore(CERT_STORE_PROV_SYSTEM_W, 0, 0,
|
HCERTSTORE ca = CertOpenStore(CERT_STORE_PROV_SYSTEM_W, 0, 0,
|
||||||
CERT_SYSTEM_STORE_CURRENT_USER, Root);
|
CERT_SYSTEM_STORE_CURRENT_USER, CA);
|
||||||
|
|
||||||
if (root)
|
if (ca)
|
||||||
{
|
{
|
||||||
find_and_delete_cert_in_store(root, "root", info.u.pCertContext,
|
find_and_delete_cert_in_store(ca, "CA",
|
||||||
"v1CertWithValidPubKey", FALSE);
|
info.u.pCertContext, "v1CertWithValidPubKey", FALSE);
|
||||||
CertCloseStore(root, 0);
|
CertCloseStore(ca, 0);
|
||||||
}
|
}
|
||||||
}
|
}
|
||||||
CertFreeCertificateContext(info.u.pCertContext);
|
CertFreeCertificateContext(info.u.pCertContext);
|
||||||
|
|
Loading…
Reference in New Issue